In time, the expansion of This system to a full wafer, or far better, the usage of a superior resolution X-ray diffraction imaging (XRDI) method, to create a complete 3D defect map with the Clever Cut layer will be beneficial to establish the defect density around The complete wafer. Semiconductor https://www.facebook.com/permalink.php?story_fbid=pfbid0FHeTxfkLKsmuMojqgNnafZDwyozm3yxChk5FbNzfVtdqZ7JuijdhjAKbFB4azyBPl&id=61560512640678&__cft__[0]=AZXALD9zIcx2F8S9xh8_2bVAsCzzsveQAGs8WL7wILUjU2lPJdLAFO3fcQiMK8fqnThmNMw0TDaAr-S3PVDQ_Uk2lDZ5HCGBDhVD4yZetOXk7rsxTPFh0L-NtVM9byoglCNAUYhDXk5iU_S_wNkWWrkMH1pu5Mur08iVKf418wrZhc0r-6xkwNYrb2NfHYXe4tDYhkUeNXLkVROuzqDYbYRi&__tn__=%2CO%2CP-R